WIMS Seminar

Design of Low Noise CMOS Amplifiers

James R. Hellums, PhD
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James R. Hellums,
TI Fellow
Texas Instruments

ABSTRACT:
Methods to analyze noise and offset for several different amplifier topologies from CMOS and Bipolar technologies will be presented. Both single-ended and fully differential amplifiers will be included in the talk. The presentation will cover the noise models and mismatch models used in TI-SPICE. Results from the analysis will be applied to show how to design very low noise and offset amplifiers. Also analysis of resistive and switched-capacitor feedback amplifier systems will be presented.

BIO:
Dr. James Hellums joined TI 22 years ago after working six and a half years at MOSTEK and Nova Monolithics, which he co-founded. In his career, he has designed of 49 product IC’s, 39 at TI. The areas in which he has worked includes Telecom, Wireless, DSL, Audio, Custom mixed-signal and catalog Data Converters, Opamps and Comparators. He was elected a TI Fellow in 1997.

Sponsored by

WIMS ERC Seminar Series